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Characterization of Insect Resistance Loci in the USDA Soybean Germplasm Collection Using Genome-Wide Association Studies

Management of insects that cause economic damage to yields of soybean mainly rely on insecticide applications. Sources of resistance in soybean plant introductions (PIs) to different insect pests have been reported, and some of these sources, like for the soybean aphid (SBA), have been used to devel...

Täydet tiedot

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Bibliografiset tiedot
Julkaisussa:Front Plant Sci
Päätekijät: Chang, Hao-Xun, Hartman, Glen L.
Aineistotyyppi: Artigo
Kieli:Inglês
Julkaistu: Frontiers Media S.A. 2017
Aiheet:
Linkit:https://ncbi.nlm.nih.gov/pmc/articles/PMC5430066/
https://ncbi.nlm.nih.gov/pubmed/28555141
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.3389/fpls.2017.00670
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