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Optical identification of sulfur vacancies: Bound excitons at the edges of monolayer tungsten disulfide
Defects play a significant role in tailoring the optical properties of two-dimensional materials. Optical signatures of defect-bound excitons are important tools to probe defective regions and thus interrogate the optical quality of as-grown semiconducting monolayer materials. We have performed a sy...
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| 出版年: | Sci Adv |
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| 主要な著者: | , , , , , , , , , , , , |
| フォーマット: | Artigo |
| 言語: | Inglês |
| 出版事項: |
American Association for the Advancement of Science
2017
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| 主題: | |
| オンライン･アクセス: | https://ncbi.nlm.nih.gov/pmc/articles/PMC5409454/ https://ncbi.nlm.nih.gov/pubmed/28508048 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1126/sciadv.1602813 |
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