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Measuring adhesion on rough surfaces using atomic force microscopy with a liquid probe
We present a procedure to perform and interpret pull-off force measurements during the jump-off-contact process between a liquid drop and rough surfaces using a conventional atomic force microscope. In this method, a micrometric liquid mercury drop is attached to an AFM tipless cantilever to measure...
Gorde:
| Argitaratua izan da: | Beilstein J Nanotechnol |
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| Egile Nagusiak: | , , |
| Formatua: | Artigo |
| Hizkuntza: | Inglês |
| Argitaratua: |
Beilstein-Institut
2017
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| Gaiak: | |
| Sarrera elektronikoa: | https://ncbi.nlm.nih.gov/pmc/articles/PMC5405680/ https://ncbi.nlm.nih.gov/pubmed/28503393 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.3762/bjnano.8.84 |
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