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Quantitative evaluation of statistical errors in small-angle X-ray scattering measurements

A new model is proposed for the measurement errors incurred in typical small-angle X-ray scattering (SAXS) experiments, which takes into account the setup geometry and physics of the measurement process. The model accurately captures the experimentally determined errors from a large range of synchro...

Deskribapen osoa

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Xehetasun bibliografikoak
Argitaratua izan da:J Appl Crystallogr
Egile Nagusiak: Sedlak, Steffen M., Bruetzel, Linda K., Lipfert, Jan
Formatua: Artigo
Hizkuntza:Inglês
Argitaratua: International Union of Crystallography 2017
Gaiak:
Sarrera elektronikoa:https://ncbi.nlm.nih.gov/pmc/articles/PMC5377352/
https://ncbi.nlm.nih.gov/pubmed/28381982
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1107/S1600576717003077
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