Wang, X., Liu, H., Zhao, L., Fei, C., Feng, X., Chen, S., & Wang, Y. (2017). Structural Properties Characterized by the Film Thickness and Annealing Temperature for La(2)O(3) Films Grown by Atomic Layer Deposition. Nanoscale Res Lett.
Styl ChicagoWang, Xing, Hongxia Liu, Lu Zhao, Chenxi Fei, Xingyao Feng, Shupeng Chen, a Yongte Wang. "Structural Properties Characterized By the Film Thickness and Annealing Temperature for La(2)O(3) Films Grown By Atomic Layer Deposition." Nanoscale Res Lett 2017.
Citace podle MLAWang, Xing, et al. "Structural Properties Characterized By the Film Thickness and Annealing Temperature for La(2)O(3) Films Grown By Atomic Layer Deposition." Nanoscale Res Lett 2017.
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