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Thin-film metallic glass: an effective diffusion barrier for Se-doped AgSbTe(2) thermoelectric modules

The thermal stability of joints in thermoelectric (TE) modules, which are degraded during interdiffusion between the TE material and the contacting metal, needs to be addressed in order to utilize TE technology for competitive, sustainable energy applications. Herein, we deposit a 200 nm-thick Zr-ba...

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Detalles Bibliográficos
Publicado en:Sci Rep
Main Authors: Yu, Chia-Chi, Wu, Hsin-jay, Deng, Ping-Yuan, Agne, Matthias T., Snyder, G. Jeffrey, Chu, Jinn P.
Formato: Artigo
Idioma:Inglês
Publicado: Nature Publishing Group 2017
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Acceso en liña:https://ncbi.nlm.nih.gov/pmc/articles/PMC5361086/
https://ncbi.nlm.nih.gov/pubmed/28327655
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1038/srep45177
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