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Interlaced zone plate optics for hard X-ray imaging in the 10 nm range

Multi-keV X-ray microscopy has been particularly successful in bridging the resolution gap between optical and electron microscopy. However, resolutions below 20 nm are still considered challenging, as high throughput direct imaging methods are limited by the availability of suitable optical element...

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Detalhes bibliográficos
Publicado no:Sci Rep
Main Authors: Mohacsi, Istvan, Vartiainen, Ismo, Rösner, Benedikt, Guizar-Sicairos, Manuel, Guzenko, Vitaliy A., McNulty, Ian, Winarski, Robert, Holt, Martin V., David, Christian
Formato: Artigo
Idioma:Inglês
Publicado em: Nature Publishing Group 2017
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Acesso em linha:https://ncbi.nlm.nih.gov/pmc/articles/PMC5343657/
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1038/srep43624
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