Perfect X-ray focusing via fitting corrective glasses to aberrated optics

Due to their short wavelength, X-rays can in principle be focused down to a few nanometres and below. At the same time, it is this short wavelength that puts stringent requirements on X-ray optics and their metrology. Both are limited by today's technology. In this work, we present accurate at...

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Bibliografske podrobnosti
izdano v:Nat Commun
Main Authors: Seiboth, Frank, Schropp, Andreas, Scholz, Maria, Wittwer, Felix, Rödel, Christian, Wünsche, Martin, Ullsperger, Tobias, Nolte, Stefan, Rahomäki, Jussi, Parfeniukas, Karolis, Giakoumidis, Stylianos, Vogt, Ulrich, Wagner, Ulrich, Rau, Christoph, Boesenberg, Ulrike, Garrevoet, Jan, Falkenberg, Gerald, Galtier, Eric C., Ja Lee, Hae, Nagler, Bob, Schroer, Christian G.
Format: Artigo
Jezik:Inglês
Izdano: Nature Publishing Group 2017
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Article
Online dostop:https://ncbi.nlm.nih.gov/pmc/articles/PMC5337966/
https://ncbi.nlm.nih.gov/pubmed/28248317
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1038/ncomms14623
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