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Integrating Sphere Microscopy for Direct Absorption Measurements of Single Nanostructures
[Image: see text] Nanoscale materials are promising for optoelectronic devices because their physical dimensions are on the order of the wavelength of light. This leads to a variety of complex optical phenomena that, for instance, enhance absorption and emission. However, quantifying the performance...
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| Published in: | ACS Nano |
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| Main Authors: | , , , , , , |
| Format: | Artigo |
| Language: | Inglês |
| Published: |
American
Chemical Society
2017
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| Online Access: | https://ncbi.nlm.nih.gov/pmc/articles/PMC5333184/ https://ncbi.nlm.nih.gov/pubmed/28056171 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1021/acsnano.6b06534 |
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