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Chemical Purity by Dielectric Cryometry
A consideration of the deficiencies in standard methods used for the cryometric determination of purity has led to a new approach in which the measurement of an intensive rather than an extensive property is the controlling factor. This method, measurement of the dielectric constant as a function of...
Enregistré dans:
| Publié dans: | J Res Natl Bur Stand A Phys Chem |
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| Auteurs principaux: | , |
| Format: | Artigo |
| Langue: | Inglês |
| Publié: |
[Gaithersburg, MD] : U.S. Dept. of Commerce, National Institute of Standards and Technology
1963
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| Sujets: | |
| Accès en ligne: | https://ncbi.nlm.nih.gov/pmc/articles/PMC5322778/ https://ncbi.nlm.nih.gov/pubmed/31580606 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.6028/jres.067A.060 |
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