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Mutiple Ionization of Rare Gases by Electron Impact
Electron impact studies of multiple ionization processes in helium, neon, argon, and xenon appear to support theoretical conclusions that the threshold probability for n-fold ionization is proportional to the nth power of the electron energy in excess of the threshold energy. The probability law app...
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| Publicat a: | J Res Natl Bur Stand A Phys Chem |
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| Autors principals: | , , |
| Format: | Artigo |
| Idioma: | Inglês |
| Publicat: |
[Gaithersburg, MD] : U.S. Dept. of Commerce, National Institute of Standards and Technology
1959
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| Matèries: | |
| Accés en línia: | https://ncbi.nlm.nih.gov/pmc/articles/PMC5287033/ https://ncbi.nlm.nih.gov/pubmed/31216129 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.6028/jres.063A.015 |
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