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Imaging Nanoscale Electromagnetic Near-Field Distributions Using Optical Forces
We demonstrate the application of Atomic Force Microscopy (AFM) for mapping optical near-fields with nanometer resolution, limited only by the AFM probe geometry. By detecting the optical force between a gold coated AFM probe and its image dipole on a glass substrate, we profile the electric field d...
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| Publicado en: | Sci Rep |
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| Main Authors: | , , , , |
| Formato: | Artigo |
| Idioma: | Inglês |
| Publicado: |
Nature Publishing Group
2015
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| Assuntos: | |
| Acceso en liña: | https://ncbi.nlm.nih.gov/pmc/articles/PMC5155520/ https://ncbi.nlm.nih.gov/pubmed/26073331 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1038/srep10610 |
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