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Depth resolved lattice-charge coupling in epitaxial BiFeO(3) thin film
For epitaxial films, a critical thickness (t(c)) can create a phenomenological interface between a strained bottom layer and a relaxed top layer. Here, we present an experimental report of how the t(c) in BiFeO(3) thin films acts as a boundary to determine the crystalline phase, ferroelectricity, an...
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| 出版年: | Sci Rep |
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| 主要な著者: | , , , , , , , , , , |
| フォーマット: | Artigo |
| 言語: | Inglês |
| 出版事項: |
Nature Publishing Group
2016
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| 主題: | |
| オンライン・アクセス: | https://ncbi.nlm.nih.gov/pmc/articles/PMC5144002/ https://ncbi.nlm.nih.gov/pubmed/27929103 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1038/srep38724 |
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