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Pushing the limits of crystallography

A very serious concern of scientists dealing with crystal structure refinement, including theoretical research, pertains to the characteristic bias in calculated versus measured diffraction intensities, observed particularly in the weak reflection regime. This bias is here attributed to corrective f...

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Bibliografski detalji
Izdano u:J Appl Crystallogr
Glavni autori: Wolny, Janusz, Buganski, Ireneusz, Kuczera, Pawel, Strzalka, Radoslaw
Format: Artigo
Jezik:Inglês
Izdano: International Union of Crystallography 2016
Teme:
Online pristup:https://ncbi.nlm.nih.gov/pmc/articles/PMC5139996/
https://ncbi.nlm.nih.gov/pubmed/27980514
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1107/S160057671601637X
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