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Pushing the limits of crystallography

A very serious concern of scientists dealing with crystal structure refinement, including theoretical research, pertains to the characteristic bias in calculated versus measured diffraction intensities, observed particularly in the weak reflection regime. This bias is here attributed to corrective f...

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Detalhes bibliográficos
Publicado no:J Appl Crystallogr
Main Authors: Wolny, Janusz, Buganski, Ireneusz, Kuczera, Pawel, Strzalka, Radoslaw
Formato: Artigo
Idioma:Inglês
Publicado em: International Union of Crystallography 2016
Assuntos:
Acesso em linha:https://ncbi.nlm.nih.gov/pmc/articles/PMC5139996/
https://ncbi.nlm.nih.gov/pubmed/27980514
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1107/S160057671601637X
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