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Evolution of structural distortion in BiFeO(3) thin films probed by second-harmonic generation

BiFeO(3) thin films have drawn much attention due to its potential applications for novel magnetoelectric devices and fundamental physics in magnetoelectric coupling. However, the structural evolution of BiFeO(3) films with thickness remains controversial. Here we use an optical second-harmonic gene...

Täydet tiedot

Tallennettuna:
Bibliografiset tiedot
Julkaisussa:Sci Rep
Päätekijät: Wang, Jie-su, Jin, Kui-juan, Guo, Hai-zhong, Gu, Jun-xing, Wan, Qian, He, Xu, Li, Xiao-long, Xu, Xiu-lai, Yang, Guo-zhen
Aineistotyyppi: Artigo
Kieli:Inglês
Julkaistu: Nature Publishing Group 2016
Aiheet:
Linkit:https://ncbi.nlm.nih.gov/pmc/articles/PMC5131282/
https://ncbi.nlm.nih.gov/pubmed/27905565
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1038/srep38268
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