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Surface studies of solids using integral X-ray-induced photoemission yield
X-ray induced photoemission yield contains structural information complementary to that provided by X-ray Fresnel reflectivity, which presents an advantage to a wide variety of surface studies if this information is made easily accessible. Photoemission in materials research is commonly acknowledged...
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| Vydáno v: | Sci Rep |
|---|---|
| Hlavní autoři: | , , |
| Médium: | Artigo |
| Jazyk: | Inglês |
| Vydáno: |
Nature Publishing Group
2016
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| Témata: | |
| On-line přístup: | https://ncbi.nlm.nih.gov/pmc/articles/PMC5118721/ https://ncbi.nlm.nih.gov/pubmed/27874041 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1038/srep37440 |
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