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Controlled tip wear on high roughness surfaces yields gradual broadening and rounding of cantilever tips
Tip size in atomic force microscopy (AFM) has a major impact on the resolution of images and on the results of nanoindentation experiments. Tip wear is therefore a key limitation in the application of AFM. Here we show, however, how wear can be turned into an advantage as it allows for directed tip...
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| Publicado no: | Sci Rep |
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| Main Authors: | , , , |
| Formato: | Artigo |
| Idioma: | Inglês |
| Publicado em: |
Nature Publishing Group
2016
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| Assuntos: | |
| Acesso em linha: | https://ncbi.nlm.nih.gov/pmc/articles/PMC5105056/ https://ncbi.nlm.nih.gov/pubmed/27833143 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1038/srep36972 |
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