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Active nanocharacterization of nanofunctional materials by scanning tunneling microscopy

Recent developments in the application of scanning tunneling microscopy (STM) to nanofabrication and nanocharacterization are reviewed. The main focus of this paper is to outline techniques for depositing and manipulating nanometer-scale structures using STM tips. Firstly, the transfer of STM tip ma...

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Shranjeno v:
Bibliografske podrobnosti
izdano v:Sci Technol Adv Mater
Main Authors: Fujita, Daisuke, Sagisaka, Keisuke
Format: Artigo
Jezik:Inglês
Izdano: Taylor & Francis 2008
Teme:
Online dostop:https://ncbi.nlm.nih.gov/pmc/articles/PMC5099790/
https://ncbi.nlm.nih.gov/pubmed/27877921
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1088/1468-6996/9/1/013003
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