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Ambience-sensitive optical refraction in ferroelectric nanofilms of NaNbO(3)
Optical index of refraction n is studied by spectroscopic ellipsometry in epitaxial nanofilms of NaNbO(3) with thickness ∼10 nm grown on different single-crystal substrates. The index n in the transparency spectral range (n ≈ 2.1 – 2.2) exhibits a strong sensitivity to atmospheric-pressure gas ambie...
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| Pubblicato in: | Sci Technol Adv Mater |
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| Autori principali: | , , , , , , |
| Natura: | Artigo |
| Lingua: | Inglês |
| Pubblicazione: |
Taylor & Francis
2014
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| Soggetti: | |
| Accesso online: | https://ncbi.nlm.nih.gov/pmc/articles/PMC5090690/ https://ncbi.nlm.nih.gov/pubmed/27877702 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1088/1468-6996/15/4/045001 |
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