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Gate bias-dependent junction characteristics of silicon nanowires suspended between polysilicon electrodes

Realistic integration of 1D materials into future nanodevices is limited by the lack of a manipulation process that allows a large number of nanowires to be arranged into an integrated circuit. In this work, we have grown Si nanowire bridges using a thin-film catalyst in a batch process at 200 °C an...

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Pubblicato in:Sci Technol Adv Mater
Autori principali: Lee, Yun-Hi, Park, Sungim
Natura: Artigo
Lingua:Inglês
Pubblicazione: Taylor & Francis 2011
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Accesso online:https://ncbi.nlm.nih.gov/pmc/articles/PMC5090679/
https://ncbi.nlm.nih.gov/pubmed/27877464
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1088/1468-6996/12/6/065004
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