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A simple method for the quantification of molecular decorations on silica particles

A simple, rapid quantitative approach to determining attachment density on silica nanoparticles has been demonstrated using attenuated total reflectance Fourier transform infrared spectroscopy and verified by thermogravimetric analysis. A very high attachment of approximately 5 attachments per nm(2)...

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Detalhes bibliográficos
Publicado no:Sci Technol Adv Mater
Main Authors: Mangos, Daniel N, Nakanishi, Takashi, Lewis, David A
Formato: Artigo
Idioma:Inglês
Publicado em: Taylor & Francis 2014
Assuntos:
Acesso em linha:https://ncbi.nlm.nih.gov/pmc/articles/PMC5090605/
https://ncbi.nlm.nih.gov/pubmed/27877644
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1088/1468-6996/15/1/015002
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