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A simple method for the quantification of molecular decorations on silica particles
A simple, rapid quantitative approach to determining attachment density on silica nanoparticles has been demonstrated using attenuated total reflectance Fourier transform infrared spectroscopy and verified by thermogravimetric analysis. A very high attachment of approximately 5 attachments per nm(2)...
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| Gepubliceerd in: | Sci Technol Adv Mater |
|---|---|
| Hoofdauteurs: | , , |
| Formaat: | Artigo |
| Taal: | Inglês |
| Gepubliceerd in: |
Taylor & Francis
2014
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| Onderwerpen: | |
| Online toegang: | https://ncbi.nlm.nih.gov/pmc/articles/PMC5090605/ https://ncbi.nlm.nih.gov/pubmed/27877644 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1088/1468-6996/15/1/015002 |
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