A carregar...

Intrinsic stability of ferroelectric and piezoelectric properties of epitaxial PbZr(0.45)Ti(0.55)O(3) thin films on silicon in relation to grain tilt

Piezoelectric thin films of PbZr(0.45)Ti(0.55)O(3) were grown on Si substrates in four different ways, resulting in different crystalline structures, as determined by x-ray analysis. The crystalline structures were different in the spread in tilt angle and the in-plane alignment of the crystal plane...

ver descrição completa

Na minha lista:
Detalhes bibliográficos
Publicado no:Sci Technol Adv Mater
Main Authors: Houwman, Evert P, Nguyen, Minh D, Dekkers, Matthijn, Rijnders, Guus
Formato: Artigo
Idioma:Inglês
Publicado em: Taylor & Francis 2013
Assuntos:
Acesso em linha:https://ncbi.nlm.nih.gov/pmc/articles/PMC5090325/
https://ncbi.nlm.nih.gov/pubmed/27877599
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1088/1468-6996/14/4/045006
Tags: Adicionar Tag
Sem tags, seja o primeiro a adicionar uma tag!