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Fast Industrial Inspection of Optical Thin Film Using Optical Coherence Tomography
An application of spectral domain optical coherence tomography (SD-OCT) was demonstrated for a fast industrial inspection of an optical thin film panel. An optical thin film sample similar to a liquid crystal display (LCD) panel was examined. Two identical SD-OCT systems were utilized for parallel s...
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| Publicado no: | Sensors (Basel) |
|---|---|
| Main Authors: | , , , , , , , |
| Formato: | Artigo |
| Idioma: | Inglês |
| Publicado em: |
MDPI
2016
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| Assuntos: | |
| Acesso em linha: | https://ncbi.nlm.nih.gov/pmc/articles/PMC5087387/ https://ncbi.nlm.nih.gov/pubmed/27690043 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.3390/s16101598 |
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