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Micrometer-resolution imaging using MÖNCH: towards G(2)-less grating interferometry
MÖNCH is a 25 µm-pitch charge-integrating detector aimed at exploring the limits of current hybrid silicon detector technology. The small pixel size makes it ideal for high-resolution imaging. With an electronic noise of about 110 eV r.m.s., it opens new perspectives for many synchrotron application...
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Publicado no: | J Synchrotron Radiat |
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Main Authors: | , , , , , , , , , , , , , , , , , , , , |
Formato: | Artigo |
Idioma: | Inglês |
Publicado em: |
International Union of Crystallography
2016
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Assuntos: | |
Acesso em linha: | https://ncbi.nlm.nih.gov/pmc/articles/PMC5082464/ https://ncbi.nlm.nih.gov/pubmed/27787252 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1107/S1600577516014788 |
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