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A novel high-throughput fatigue testing method for metallic thin films
Thin films are used in a wide variety of computing and communication applications although their fatigue behavior and its dependence on alloying elements are not very well known. In this paper, we present an experimental implementation of a novel high-throughput fatigue testing method for metallic t...
Gorde:
| Argitaratua izan da: | Sci Technol Adv Mater |
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| Egile Nagusiak: | , , , , |
| Formatua: | Artigo |
| Hizkuntza: | Inglês |
| Argitaratua: |
Taylor & Francis
2011
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| Gaiak: | |
| Sarrera elektronikoa: | https://ncbi.nlm.nih.gov/pmc/articles/PMC5074423/ https://ncbi.nlm.nih.gov/pubmed/27877429 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1088/1468-6996/12/5/054202 |
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