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Photothermally excited force modulation microscopy for broadband nanomechanical property measurements
We demonstrate photothermally excited force modulation microscopy (PTE FMM) for mechanical property characterization across a broad frequency range with an atomic force microscope (AFM). Photothermal excitation allows for an AFM cantilever driving force that varies smoothly as a function of drive fr...
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| Published in: | Appl Phys Lett |
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| Main Authors: | , |
| Format: | Artigo |
| Language: | Inglês |
| Published: |
2015
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| Subjects: | |
| Online Access: | https://ncbi.nlm.nih.gov/pmc/articles/PMC5057186/ https://ncbi.nlm.nih.gov/pubmed/27746480 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1063/1.4935982 |
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