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Thermally induced crystallization in NbO(2) thin films
Niobium dioxide can exhibit negative differential resistance (NDR) in metal-insulator-metal (MIM) devices, which has recently attracted significant interest for its potential applications as a highly non-linear selector element in emerging nonvolatile memory (NVM) and as a locally-active element in...
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| Foilsithe in: | Sci Rep |
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| Main Authors: | , , , , , , , , , , , |
| Formáid: | Artigo |
| Teanga: | Inglês |
| Foilsithe: |
Nature Publishing Group
2016
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| Ábhair: | |
| Rochtain Ar Líne: | https://ncbi.nlm.nih.gov/pmc/articles/PMC5041100/ https://ncbi.nlm.nih.gov/pubmed/27682633 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1038/srep34294 |
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