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Defect Detection in Textures through the Use of Entropy as a Means for Automatically Selecting the Wavelet Decomposition Level

This paper presents a robust method for defect detection in textures, entropy-based automatic selection of the wavelet decomposition level (EADL), based on a wavelet reconstruction scheme, for detecting defects in a wide variety of structural and statistical textures. Two main features are presented...

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Bibliografski detalji
Izdano u:Sensors (Basel)
Glavni autori: Navarro, Pedro J., Fernández-Isla, Carlos, Alcover, Pedro María, Suardíaz, Juan
Format: Artigo
Jezik:Inglês
Izdano: MDPI 2016
Teme:
Online pristup:https://ncbi.nlm.nih.gov/pmc/articles/PMC5017344/
https://ncbi.nlm.nih.gov/pubmed/27472343
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.3390/s16081178
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