APA Alıntı

Hannon, A. F., Sunday, D. F., Windover, D., & Kline, R. J. (2016). Advancing X-ray scattering metrology using inverse genetic algorithms. J Micro Nanolithogr MEMS MOEMS.

Chicago Stili Alıntı

Hannon, Adam F., Daniel F. Sunday, Donald Windover, ve R. Joseph Kline. "Advancing X-ray Scattering Metrology Using Inverse Genetic Algorithms." J Micro Nanolithogr MEMS MOEMS 2016.

MLA Alıntı

Hannon, Adam F., Daniel F. Sunday, Donald Windover, ve R. Joseph Kline. "Advancing X-ray Scattering Metrology Using Inverse Genetic Algorithms." J Micro Nanolithogr MEMS MOEMS 2016.