Chawla, V., Holec, D., & Mayrhofer, P. H. (2012). Interfacial coherency stress distribution in TiN/AlN bilayer and multilayer films studied by FEM analysis. Comput Mater Sci.
Chicago-stil citatChawla, Vipin, David Holec, och Paul H. Mayrhofer. "Interfacial Coherency Stress Distribution in TiN/AlN Bilayer and Multilayer Films Studied By FEM Analysis." Comput Mater Sci 2012.
MLA-referensChawla, Vipin, David Holec, och Paul H. Mayrhofer. "Interfacial Coherency Stress Distribution in TiN/AlN Bilayer and Multilayer Films Studied By FEM Analysis." Comput Mater Sci 2012.
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