Wimmer, Y., El-Sayed, A., Gös, W., Grasser, T., & Shluger, A. L. (2016). Role of hydrogen in volatile behaviour of defects in SiO(2)-based electronic devices. Proc Math Phys Eng Sci.

Wimmer, Yannick, Al-Moatasem El-Sayed, Wolfgang Gös, Tibor Grasser, und Alexander L. Shluger. "Role of Hydrogen in Volatile Behaviour of Defects in SiO(2)-based Electronic Devices." Proc Math Phys Eng Sci 2016.

Wimmer, Yannick, et al. "Role of Hydrogen in Volatile Behaviour of Defects in SiO(2)-based Electronic Devices." Proc Math Phys Eng Sci 2016.