एपीए उद्धरण

Carlton, H. D., Elmer, J. W., Li, Y., Pacheco, M., Goyal, D., Parkinson, D. Y., & MacDowell, A. A. (2016). Using Synchrotron Radiation Microtomography to Investigate Multi-scale Three-dimensional Microelectronic Packages. J Vis Exp.

शिकागो स्टाइल उद्धरण

Carlton, Holly D., John W. Elmer, Yan Li, Mario Pacheco, Deepak Goyal, Dilworth Y. Parkinson, और Alastair A. MacDowell. "Using Synchrotron Radiation Microtomography to Investigate Multi-scale Three-dimensional Microelectronic Packages." J Vis Exp 2016.

एमएलए उद्धरण

Carlton, Holly D., et al. "Using Synchrotron Radiation Microtomography to Investigate Multi-scale Three-dimensional Microelectronic Packages." J Vis Exp 2016.