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Optical diffraction for measurements of nano-mechanical bending

We explore and exploit diffraction effects that have been previously neglected when modelling optical measurement techniques for the bending of micro-mechanical transducers such as cantilevers for atomic force microscopy. The illumination of a cantilever edge causes an asymmetric diffraction pattern...

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Библиографические подробности
Опубликовано в: :Sci Rep
Главные авторы: Hermans, Rodolfo I., Dueck, Benjamin, Ndieyira, Joseph Wafula, McKendry, Rachel A., Aeppli, Gabriel
Формат: Artigo
Язык:Inglês
Опубликовано: Nature Publishing Group 2016
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Online-ссылка:https://ncbi.nlm.nih.gov/pmc/articles/PMC4891711/
https://ncbi.nlm.nih.gov/pubmed/27255427
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1038/srep26690
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