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Optical diffraction for measurements of nano-mechanical bending
We explore and exploit diffraction effects that have been previously neglected when modelling optical measurement techniques for the bending of micro-mechanical transducers such as cantilevers for atomic force microscopy. The illumination of a cantilever edge causes an asymmetric diffraction pattern...
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| Опубликовано в: : | Sci Rep |
|---|---|
| Главные авторы: | , , , , |
| Формат: | Artigo |
| Язык: | Inglês |
| Опубликовано: |
Nature Publishing Group
2016
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| Предметы: | |
| Online-ссылка: | https://ncbi.nlm.nih.gov/pmc/articles/PMC4891711/ https://ncbi.nlm.nih.gov/pubmed/27255427 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1038/srep26690 |
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