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IOTA: integration optimization, triage and analysis tool for the processing of XFEL diffraction images
Serial femtosecond crystallography (SFX) uses an X-ray free-electron laser to extract diffraction data from crystals not amenable to conventional X-ray light sources owing to their small size or radiation sensitivity. However, a limitation of SFX is the high variability of the diffraction images tha...
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| 出版年: | J Appl Crystallogr |
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| 主要な著者: | , , , , , , , , |
| フォーマット: | Artigo |
| 言語: | Inglês |
| 出版事項: |
International Union of Crystallography
2016
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| 主題: | |
| オンライン･アクセス: | https://ncbi.nlm.nih.gov/pmc/articles/PMC4886991/ https://ncbi.nlm.nih.gov/pubmed/27275148 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1107/S1600576716006683 |
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