Cargando...
Modeling truncated pixel values of faint reflections in MicroED images
The weak pixel counts surrounding the Bragg spots in a diffraction image are important for establishing a model of the background underneath the peak and estimating the reliability of the integrated intensities. Under certain circumstances, particularly with equipment not optimized for low-intensity...
Gardado en:
| Publicado en: | J Appl Crystallogr |
|---|---|
| Main Authors: | , , , , |
| Formato: | Artigo |
| Idioma: | Inglês |
| Publicado: |
International Union of Crystallography
2016
|
| Assuntos: | |
| Acceso en liña: | https://ncbi.nlm.nih.gov/pmc/articles/PMC4886988/ https://ncbi.nlm.nih.gov/pubmed/27275145 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1107/S1600576716007196 |
| Tags: |
Engadir etiqueta
Sen Etiquetas, Sexa o primeiro en etiquetar este rexistro!
|