טוען...
Diffraction Line Broadening Analysis if Broadening Is Caused by Both Dislocations and Limited Crystallite Size
The determination of dislocation distribution parameters is discussed for specimens where both strain broadening caused by dislocations and size broadening occur. If the strain broadening is well described by a model due to Wilkens, several methods are possible for the analysis of the broadening of...
שמור ב:
| הוצא לאור ב: | J Res Natl Inst Stand Technol |
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| Main Authors: | , |
| פורמט: | Artigo |
| שפה: | Inglês |
| יצא לאור: |
[Gaithersburg, MD] : U.S. Dept. of Commerce, National Institute of Standards and Technology
2004
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| נושאים: | |
| גישה מקוונת: | https://ncbi.nlm.nih.gov/pmc/articles/PMC4849624/ https://ncbi.nlm.nih.gov/pubmed/27366597 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.6028/jres.109.005 |
| תגים: |
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