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Effect of X-ray spot size on liquid jet photoelectron spectroscopy
A 30 µm pinhole is introduced in the intermediate focus of the SIM beamline at the Swiss Light Source to improve the spot size at the second downstream focus, which is used here for liquid jet X-ray photoelectron spectroscopy experiments. The 30 µm pinhole reduces the beam dimensions from 250 (v) ×...
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| 出版年: | J Synchrotron Radiat |
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| 主要な著者: | , , , |
| フォーマット: | Artigo |
| 言語: | Inglês |
| 出版事項: |
International Union of Crystallography
2015
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| 主題: | |
| オンライン･アクセス: | https://ncbi.nlm.nih.gov/pmc/articles/PMC4787839/ https://ncbi.nlm.nih.gov/pubmed/26524318 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1107/S1600577515016306 |
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