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Estimation of errors in diffraction data measured by CCD area detectors
Current methods for diffraction-spot integration from CCD area detectors typically underestimate the errors in the measured intensities. In an attempt to understand fully and identify correctly the sources of all contributions to these errors, a simulation of a CCD-based area-detector module has bee...
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| 出版年: | J Appl Crystallogr |
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| 主要な著者: | , |
| フォーマット: | Artigo |
| 言語: | Inglês |
| 出版事項: |
International Union of Crystallography
2010
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| 主題: | |
| オンライン・アクセス: | https://ncbi.nlm.nih.gov/pmc/articles/PMC4786054/ https://ncbi.nlm.nih.gov/pubmed/27006649 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1107/S0021889810033418 |
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