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Estimation of errors in diffraction data measured by CCD area detectors

Current methods for diffraction-spot integration from CCD area detectors typically underestimate the errors in the measured intensities. In an attempt to understand fully and identify correctly the sources of all contributions to these errors, a simulation of a CCD-based area-detector module has bee...

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Detalhes bibliográficos
Publicado no:J Appl Crystallogr
Main Authors: Waterman, David, Evans, Gwyndaf
Formato: Artigo
Idioma:Inglês
Publicado em: International Union of Crystallography 2010
Assuntos:
Acesso em linha:https://ncbi.nlm.nih.gov/pmc/articles/PMC4786054/
https://ncbi.nlm.nih.gov/pubmed/27006649
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1107/S0021889810033418
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