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Bias-polarity-dependent resistance switching in W/SiO(2)/Pt and W/SiO(2)/Si/Pt structures
SiO(2) is the most significantly used insulator layer in semiconductor devices. Its functionality was recently extended to resistance switching random access memory, where the defective SiO(2) played an active role as the resistance switching (RS) layer. In this report, the bias-polarity-dependent R...
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| Publicado no: | Sci Rep |
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| Main Authors: | , , , , , , , |
| Formato: | Artigo |
| Idioma: | Inglês |
| Publicado em: |
Nature Publishing Group
2016
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| Assuntos: | |
| Acesso em linha: | https://ncbi.nlm.nih.gov/pmc/articles/PMC4768181/ https://ncbi.nlm.nih.gov/pubmed/26916050 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1038/srep22216 |
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