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Anti-scatter grid artifact elimination for high resolution x-ray imaging CMOS detectors
Higher resolution in dynamic radiological imaging such as angiography is increasingly being demanded by clinicians; however, when standard anti-scatter grids are used with such new high resolution detectors, grid-line artifacts become more apparent resulting in increased structured noise that may ov...
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| Vydáno v: | Proc SPIE Int Soc Opt Eng |
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| Hlavní autoři: | , , , , |
| Médium: | Artigo |
| Jazyk: | Inglês |
| Vydáno: |
2015
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| Témata: | |
| On-line přístup: | https://ncbi.nlm.nih.gov/pmc/articles/PMC4749028/ https://ncbi.nlm.nih.gov/pubmed/26877578 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1117/12.2081430 |
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