APA način citiranja

Schäfers, F., Bischoff, P., Eggenstein, F., Erko, A., Gaupp, A., Künstner, S., . . . Zeschke, T. (2016). The at-wavelength metrology facility for UV- and XUV-reflection and diffraction optics at BESSY-II. J Synchrotron Radiat.

Čikaški stil citiranja

Schäfers, F., et al. "The At-wavelength Metrology Facility for UV- and XUV-reflection and Diffraction Optics At BESSY-II." J Synchrotron Radiat 2016.

MLA način citiranja

Schäfers, F., et al. "The At-wavelength Metrology Facility for UV- and XUV-reflection and Diffraction Optics At BESSY-II." J Synchrotron Radiat 2016.