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Conductance tomography of conductive filaments in intrinsic silicon-rich silica RRAM
We present results from an imaging study of filamentary conduction in silicon suboxide resistive RAM devices. We used a conductive atomic force microscope to etch through devices while measuring current, allowing us to produce tomograms of conductive filaments. To our knowledge this is the first rep...
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| Publié dans: | Nanoscale |
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| Auteurs principaux: | , , , , |
| Format: | Artigo |
| Langue: | Inglês |
| Publié: |
Royal Society of Chemistry
2015
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| Sujets: | |
| Accès en ligne: | https://ncbi.nlm.nih.gov/pmc/articles/PMC4718172/ https://ncbi.nlm.nih.gov/pubmed/26482563 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1039/c5nr04982b |
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