Free Form Deformation–Based Image Registration Improves Accuracy of Traction Force Microscopy

Traction Force Microscopy (TFM) is a widespread method used to recover cellular tractions from the deformation that they cause in their surrounding substrate. Particle Image Velocimetry (PIV) is commonly used to quantify the substrate’s deformations, due to its simplicity and efficiency. However, PI...

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Foilsithe in:PLoS One
Main Authors: Jorge-Peñas, Alvaro, Izquierdo-Alvarez, Alicia, Aguilar-Cuenca, Rocio, Vicente-Manzanares, Miguel, Garcia-Aznar, José Manuel, Van Oosterwyck, Hans, de-Juan-Pardo, Elena M., Ortiz-de-Solorzano, Carlos, Muñoz-Barrutia, Arrate
Formáid: Artigo
Teanga:Inglês
Foilsithe: Public Library of Science 2015
Ábhair:
Research Article
Rochtain Ar Líne:https://ncbi.nlm.nih.gov/pmc/articles/PMC4671587/
https://ncbi.nlm.nih.gov/pubmed/26641883
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1371/journal.pone.0144184
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