Exciton-dominated Dielectric Function of Atomically Thin MoS(2) Films

We systematically measure the dielectric function of atomically thin MoS(2) films with different layer numbers and demonstrate that excitonic effects play a dominant role in the dielectric function when the films are less than 5–7 layers thick. The dielectric function shows an anomalous dependence o...

詳細記述

保存先:
書誌詳細
出版年:Sci Rep
主要な著者: Yu, Yiling, Yu, Yifei, Cai, Yongqing, Li, Wei, Gurarslan, Alper, Peelaers, Hartwin, Aspnes, David E., Van de Walle, Chris G., Nguyen, Nhan V., Zhang, Yong-Wei, Cao, Linyou
フォーマット: Artigo
言語:Inglês
出版事項: Nature Publishing Group 2015
主題:
Article
オンライン･アクセス:https://ncbi.nlm.nih.gov/pmc/articles/PMC4657050/
https://ncbi.nlm.nih.gov/pubmed/26598075
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1038/srep16996
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