טוען...
Characterizing transverse coherence of an ultra-intense focused X-ray free-electron laser by an extended Young’s experiment
Characterization of transverse coherence is one of the most critical themes for advanced X-ray sources and their applications in many fields of science. However, for hard X-ray free-electron laser (XFEL) sources there is very little knowledge available on their transverse coherence characteristics,...
שמור ב:
| הוצא לאור ב: | IUCrJ |
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| Main Authors: | , , , , , , , |
| פורמט: | Artigo |
| שפה: | Inglês |
| יצא לאור: |
International Union of Crystallography
2015
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| נושאים: | |
| גישה מקוונת: | https://ncbi.nlm.nih.gov/pmc/articles/PMC4645106/ https://ncbi.nlm.nih.gov/pubmed/26594369 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1107/S2052252515015523 |
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