Yan, R., Edwards, T. J., Pankratz, L. M., Kuhn, R. J., Lanman, J. K., Liu, J., & Jiang, W. (2015). Simultaneous determination of sample thickness, tilt, and electron mean free path using tomographic tilt images based on Beer-Lambert law. J Struct Biol.
استشهاد بنمط شيكاغوYan, Rui, Thomas J. Edwards, Logan M. Pankratz, Richard J. Kuhn, Jason K. Lanman, Jun Liu, و Wen Jiang. "Simultaneous Determination of Sample Thickness, Tilt, and Electron Mean Free Path Using Tomographic Tilt Images Based On Beer-Lambert Law." J Struct Biol 2015.
MLA استشهادYan, Rui, et al. "Simultaneous Determination of Sample Thickness, Tilt, and Electron Mean Free Path Using Tomographic Tilt Images Based On Beer-Lambert Law." J Struct Biol 2015.
تحذير: قد لا تكون هذه الاستشهادات دائما دقيقة بنسبة 100%.