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Silicon Detector System for High Rate EXAFS Applications
A multichannel silicon pad detector for EXAFS (Extended X-ray Absorption Fine Structure) applications has been designed and built. The X-ray spectroscopic measurements demonstrate that an adequate energy resolution of 230 eV FWHM (corresponding to 27 rms electrons in silicon) can be achieved reliabl...
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| Publicado en: | IEEE Trans Nucl Sci |
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| Main Authors: | , , , , |
| Formato: | Artigo |
| Idioma: | Inglês |
| Publicado: |
1995
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| Assuntos: | |
| Acceso en liña: | https://ncbi.nlm.nih.gov/pmc/articles/PMC4629789/ https://ncbi.nlm.nih.gov/pubmed/26538683 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1109/23.467909 |
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