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The Effects of Grain Boundaries on the Current Transport Properties in YBCO-Coated Conductors
We report a detailed study of the grain orientations and grain boundary (GB) networks in Y(2)O(3) films grown on Ni-5 at.%W substrates. Electron back scatter diffraction (EBSD) exhibited different GB misorientation angle distributions, strongly decided by Y(2)O(3) films with different textures. The...
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| Vydáno v: | Nanoscale Res Lett |
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| Hlavní autoři: | , , , , , |
| Médium: | Artigo |
| Jazyk: | Inglês |
| Vydáno: |
Springer US
2015
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| Témata: | |
| On-line přístup: | https://ncbi.nlm.nih.gov/pmc/articles/PMC4620109/ https://ncbi.nlm.nih.gov/pubmed/26497731 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1186/s11671-015-1124-8 |
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