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Adhesion of voids to bimetal interfaces with non-uniform energies

Interface engineering has become an important strategy for designing radiation-resistant materials. Critical to its success is fundamental understanding of the interactions between interfaces and radiation-induced defects, such as voids. Using transmission electron microscopy, here we report an inte...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Veröffentlicht in:Sci Rep
Hauptverfasser: Zheng, Shijian, Shao, Shuai, Zhang, Jian, Wang, Yongqiang, Demkowicz, Michael J., Beyerlein, Irene J., Mara, Nathan A.
Format: Artigo
Sprache:Inglês
Veröffentlicht: Nature Publishing Group 2015
Schlagworte:
Online Zugang:https://ncbi.nlm.nih.gov/pmc/articles/PMC4614025/
https://ncbi.nlm.nih.gov/pubmed/26486278
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1038/srep15428
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