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Adhesion of voids to bimetal interfaces with non-uniform energies
Interface engineering has become an important strategy for designing radiation-resistant materials. Critical to its success is fundamental understanding of the interactions between interfaces and radiation-induced defects, such as voids. Using transmission electron microscopy, here we report an inte...
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| Veröffentlicht in: | Sci Rep |
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| Hauptverfasser: | , , , , , , |
| Format: | Artigo |
| Sprache: | Inglês |
| Veröffentlicht: |
Nature Publishing Group
2015
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| Schlagworte: | |
| Online Zugang: | https://ncbi.nlm.nih.gov/pmc/articles/PMC4614025/ https://ncbi.nlm.nih.gov/pubmed/26486278 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1038/srep15428 |
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