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Investigations Into the Interactions of a MALDI Matrix with Organic Thin Films Using C(60)(+) SIMS Depth Profiling

Molecular depth profiling of multilayer organic films is now an established protocol for cluster secondary ion mass spectrometry (SIMS). This unique capability is exploited here to study the ionization mechanism associated with matrix-enhanced SIMS and possibly matrix assisted laser desorption/ioniz...

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Detalhes bibliográficos
Publicado no:Surf Interface Anal
Main Authors: Lerach, Jordan O., Keskin, Selda, Winograd, Nicholas
Formato: Artigo
Idioma:Inglês
Publicado em: 2014
Assuntos:
Acesso em linha:https://ncbi.nlm.nih.gov/pmc/articles/PMC4610119/
https://ncbi.nlm.nih.gov/pubmed/26494930
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1002/sia.5545
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